Structural Characterisation of Graphene-Based Materials
Graphene production is now becoming a mature technology, with several graphene-based products already on the market, and with different production techniques routinely used, yielding materials with different properties and cost/performance.
With the proliferation of graphene producers, it has become more and more important to use reliable techniques for the characterization and comparison of different types of graphene products.
At the same time, a wide range of other 2D materials are being intensively researched at fundamental levels. The characterization of such materials also poses fundamental challenges, requiring characterization approaches which shall be different from the ones routinely used for graphene.
For these reasons, it is important for researchers of academia and industry alike to know the potentialities and limitations of the many different techniques available to characterize 2D materials.
This Graphene Study week will thus provide a strategic overview of the most common techniques and methodologies available to determine the nature, composition and behaviour of 2D nanomaterials, thin films and nanostructured composites.
Attendees will learn how different techniques can be used to probe into the internal structure and properties of a 2D material or composite. This course will be of interest to you if you are faced with questions such as:
What are the attributes of a given 2D material or composite? What is the structure-property correlation?
The programme will include:
- An introduction to what is meant by materials characterisation;
- The essential elements of the physical basis for x-ray and electron diffraction;
- Imaging, optical and electron-optical microscopies - imaging at the macroscale to the nanoscale:
- SEM/FIB‐Tomography and 3D‐Microstructure Analysis
- Introduction to (S)TEM imaging and Analysis
- Advanced electron microscopy imaging
- EELS and EDS spectroscopy
- Scanning probe techniques - physical principles and generic methodologies
- XPS spectroscopy
- X-Ray Diffraction
- Raman spectroscopy
24 January 2020 14:18